RAMOS ELOY, Bruno; BELMINO DOS SANTOS, João Antonio; BARBOSA DA CRUZ, Cleide Ane; DA SILVA QUINTINO, Heliana Mary; SOBRAL GARCEZ JÚNIOR, Sílvio; OLIVEIRA UCHÔA, Fábio. Utility Model Patent Protection Scenario in Brazil and the Indication Of Excessive Rigor in the Inventive Examination. International Journal for Innovation Education and Research, Dhaka, Bangladesh, v. 11, n. 1, p. 23–45, 2023. DOI: 10.31686/ijier.vol11.iss1.4042. Disponível em: https://scholarsjournal.net/index.php/ijier/article/view/4042.. Acesso em: 22 dec. 2024.